Electron Microscope
| EQUIPMENT | BRANDS | MODELS | APPLICATION |
|---|---|---|---|
| AFM | Bruker |
D3100, Multimode 8 Total, Veeco MultiMode 8 Nanoscope controllor, Veeco(MultiMode 8), Dimension Icon, FastScan
|
Material Topography- Surface Topography |
| JPK | NW4 | ||
| Olympus | LEXT OLS4500 | ||
| Oxford | Cypher VRS | ||
| Shimadzu | SPM9500 | ||
| Thermo Fisher Scientific |
D3100-Nanoscope V
|
||
| EBSD | JEOL | JSM-7900F | Structural Analysis-Microstructural Characterisation |
| EDS | FEI | Prisma E SEM | Composition Analysis-Elemental Analysis |
| Hitachi | S-3400N,SU8010 | ||
| JEOL |
JSM-6360LV coupled with OXFORD INCA (EDS),JSM-6490LV
|
||
| Oxford | X-MAX | ||
| Sirion | NCA X-Act | ||
| SEM | FEI |
FEI Nova,Quanta 200,Quanta FEG250
|
Microscopic Morphology-Morphology Analysis |
| JEOL |
JSM-6510,JSM-6510A,JSM-7001F,JSM-7900F,JSM-840
|
||
| Phenom | Phenom ProX | ||
| Tescan |
VEGA II XMUINCA Energy 350
|
||
| Thermal Fisher Scientific | JSM-6480LV,Quattro S | ||
| Zeiss |
EVO 18,GeminiSEM 300,GeminiSEM 500,LEO-1450,MERLINCompact,Sigma,ULTA 55
|
||
| TEM | FEI |
G2 F30,Talos F200,Talos F200C,Tecnai F20,Tecnai G2 F20,Tecnai G2 F30,Tecnai G2 F30,Tecnai Spirit,Themis Z,Titan Krios
|
Microscopic Structure-Nanostructure-Atomic Scale Imaging |
| Hitachi | HT7700 | ||
| JEOL |
JEM-1000,JEM-1400,JEM-2000FX,JEM-2010,JEM-2100,JEM-2100E,JEM-2100F,JEM-2800
|
||
| Zeiss | Crossbeam 540 |
