Electron Microscope


EQUIPMENT BRANDS MODELS APPLICATION
AFM Bruker
D3100, Multimode 8 Total, Veeco MultiMode 8 Nanoscope controllor, Veeco(MultiMode 8), Dimension Icon, FastScan
Material Topography- Surface Topography
JPK NW4
Olympus LEXT OLS4500
Oxford Cypher VRS
Shimadzu SPM9500
Thermo Fisher Scientific
D3100-Nanoscope V
EBSD JEOL JSM-7900F Structural Analysis-Microstructural Characterisation
EDS FEI Prisma E SEM Composition Analysis-Elemental Analysis
Hitachi S-3400N,SU8010
JEOL
JSM-6360LV coupled with OXFORD INCA (EDS),JSM-6490LV
Oxford X-MAX
Sirion NCA X-Act
SEM FEI
FEI Nova,Quanta 200,Quanta FEG250
Microscopic Morphology-Morphology Analysis
JEOL
JSM-6510,JSM-6510A,JSM-7001F,JSM-7900F,JSM-840
Phenom Phenom ProX
Tescan
VEGA II XMUINCA Energy 350
Thermal Fisher Scientific JSM-6480LV,Quattro S
Zeiss
EVO 18,GeminiSEM 300,GeminiSEM 500,LEO-1450,MERLINCompact,Sigma,ULTA 55
TEM FEI
G2 F30,Talos F200,Talos F200C,Tecnai F20,Tecnai G2 F20,Tecnai G2 F30,Tecnai G2 F30,Tecnai Spirit,Themis Z,Titan Krios
Microscopic Structure-Nanostructure-Atomic Scale Imaging
Hitachi HT7700
JEOL
JEM-1000,JEM-1400,JEM-2000FX,JEM-2010,JEM-2100,JEM-2100E,JEM-2100F,JEM-2800
Zeiss Crossbeam 540