Electron Microscope
EQUIPMENT | BRANDS | MODELS | APPLICATION |
---|---|---|---|
AFM | Bruker |
D3100, Multimode 8 Total, Veeco MultiMode 8 Nanoscope controllor, Veeco(MultiMode 8), Dimension Icon, FastScan
|
Material Topography- Surface Topography |
JPK | NW4 | ||
Olympus | LEXT OLS4500 | ||
Oxford | Cypher VRS | ||
Shimadzu | SPM9500 | ||
Thermo Fisher Scientific |
D3100-Nanoscope V
|
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EBSD | JEOL | JSM-7900F | Structural Analysis-Microstructural Characterisation |
EDS | FEI | Prisma E SEM | Composition Analysis-Elemental Analysis |
Hitachi | S-3400N,SU8010 | ||
JEOL |
JSM-6360LV coupled with OXFORD INCA (EDS),JSM-6490LV
|
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Oxford | X-MAX | ||
Sirion | NCA X-Act | ||
SEM | FEI |
FEI Nova,Quanta 200,Quanta FEG250
|
Microscopic Morphology-Morphology Analysis |
JEOL |
JSM-6510,JSM-6510A,JSM-7001F,JSM-7900F,JSM-840
|
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Phenom | Phenom ProX | ||
Tescan |
VEGA II XMUINCA Energy 350
|
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Thermal Fisher Scientific | JSM-6480LV,Quattro S | ||
Zeiss |
EVO 18,GeminiSEM 300,GeminiSEM 500,LEO-1450,MERLINCompact,Sigma,ULTA 55
|
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TEM | FEI |
G2 F30,Talos F200,Talos F200C,Tecnai F20,Tecnai G2 F20,Tecnai G2 F30,Tecnai G2 F30,Tecnai Spirit,Themis Z,Titan Krios
|
Microscopic Structure-Nanostructure-Atomic Scale Imaging |
Hitachi | HT7700 | ||
JEOL |
JEM-1000,JEM-1400,JEM-2000FX,JEM-2010,JEM-2100,JEM-2100E,JEM-2100F,JEM-2800
|
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Zeiss | Crossbeam 540 |